Scientific Computing Group Report - Detail view

Identifier: 2008-20

Author(s): A.C. Yucel, H. Bagci, J.S. Hesthaven, and E. Michielssen

Title: A Fast Stroud-based Collocation Method for Statiscally Characterizing EMI/EMC Phenomena on Complex Platforms

Page count: 27 pp.

Date: 2008-01-01

Abstract:

A fast stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on electrically large and loaded platforms is presented. Uncertainties in electromagnetic excitations and/or system geometry and configuration are parametrized in terms of random variables having normal or beta probability density functions. A fast time domain integral equation-based field-cable-circuit simulator is used to perform deterministic EMI/EMC simulations for excitations and/or system geometries and configurations specified by Stroud integration rules. Outputs of these simulations then are processed to compute averages and standard deviations of pertinent observables. The proposed Stroud-based collocation method requires far fewer deterministic simulations than Monte-Carlo or tensor-product integrators. To demonstrate the accuracy, efficiency, and practicality of the proposed method it is used to statistically characterize coupled voltages at the feed pins of cable-interconnected and shielded PC cards as well as the terminals of cables located in the bay of an airplane cockpit.

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